- Fabricante :
- Series :
- Packaging :
- Operating Temperature :
- Supplier Device Package :
46 Produto
Imagem | Modelo | Preço | Número | Existências | Fabricante | Descrever | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Ver |
1,582
Disponível EM stock
|
NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24SOIC | 74F | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
Ver |
1,743
Disponível EM stock
|
NXP USA Inc. | IC BUFFER/DRIVER OCTAL 24SOIC | 74F | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
Ver |
3,317
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
Ver |
3,250
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
Ver |
2,454
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
Ver |
3,808
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
Ver |
2,312
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
|
Ver |
3,215
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
|
Ver |
2,580
Disponível EM stock
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
|
Ver |
750
Disponível EM stock
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
|
Ver |
2,452
Disponível EM stock
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 74AS | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | |||
|
Ver |
1,875
Disponível EM stock
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 74AS | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | |||
|
Ver |
2,047
Disponível EM stock
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 74AS | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | |||
|
Ver |
2,638
Disponível EM stock
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 74AS | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | |||
|
Ver |
2,269
Disponível EM stock
|
Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Obsolete | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | |||
|
Ver |
3,459
Disponível EM stock
|
Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | |||
|
Ver |
1,688
Disponível EM stock
|
Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | |||
|
Ver |
3,978
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
Ver |
3,241
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
Ver |
3,912
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
|
Ver |
2,121
Disponível EM stock
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
|
Ver |
1,332
Disponível EM stock
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24SOIC | 74AS | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | |||
|
Ver |
3,794
Disponível EM stock
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24SOIC | 74AS | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | |||
|
Ver |
1,582
Disponível EM stock
|
NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24SOIC | 74F | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
Ver |
1,743
Disponível EM stock
|
NXP USA Inc. | IC BUFFER/DRIVER OCTAL 24SOIC | 74F | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
Ver |
3,317
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
Ver |
3,250
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
Ver |
2,454
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
Ver |
3,808
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
Ver |
2,312
Disponível EM stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers |
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